Conference Agenda
| Session | |
S 1: High-Performance Computing
| |
| Presentations | |
Design and Development of Miniaturized Thermal Test Chip for Advanced Interconnect and Packaging Technologies 1Berliner Nanotest und Design GmbH, Berlin, Germany; 2Fraunhofer Institute for Electronic Nano Systems, Chemnitz, Germany; 3TU Chemnitz, Center for Micro and Nano Technologies, Chemnitz, Germany Thermomechanical Analysis and Validation of an Overmoulded Package Design for Improved Thermal Interface via Selective EMC Grinding 1TU Chemnitz, Germany; 2Fraunhofer IZM, Germany; 3TU Berlin, Germany; 4Fraunhofer ENAS, Germany Experimental Investigation of Warpage-Induced Thermal Performance Degradation in HPC Packages Using Thermal Test Vehicles 1DS&A LLC, United States of America; 2Nanotest, Berlin, Germany | |