Conference Agenda
Overview and details of the sessions of this conference. Please select a date or location to show only sessions at that day or location. Please select a single session for detailed view (with abstracts and downloads if available).
Please note that all times are shown in the time zone of the conference. The current conference time is: 25th Aug 2026, 07:44:24pm CEST
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Daily Overview |
Limits of Nickel Diffusion Barriers at High Operating Temperatures
University of Rostock, Germany
Smart Evaluation of Interconnect Quality Test Methods in LED Packages using Controlled Defects
ams-OSRAM international GmbH, Germany
Infrared Detection of Crack-Tip-Associated Thermal Signatures Under Cyclic Loading: From Bulk Plexiglas Specimens to Bimaterial Interfaces
1: University of Technology Chemnitz; 2: Berliner Nanotest und Design GmbH
Controlled Excitation of a Nonlinear Resonant Cantilever System for Experimental Delamination Characterization in High-Performance Computing Packages
1: Chemnitz University of Technology, Dept. Materials & Reliability of Microsystems, Chemnitz, Germany; 2: Fraunhofer IZM, Berlin, Germany; 3: Fraunhofer ENAS, Chemnitz, Germany; 4: Centre for Micro- and Nanotechnologies (ZfM), Chemnitz, Germany; 5: Centre for Materials, Architectures and Integration of Nanomembranes (MAIN), Chemnitz, Germany
Identifying Failure Root Causes at Cu-Cu Interfaces of Vias using EBAC Analysis
1: Materials Center Leoben Forschung GmbH, Austria; 2: AT & S Austria Technologie & Systemtechnik Aktiengesellschaft
Stacked Si-on–GaN Architectures: Unlocking Reliability for Ultra-Compact Half-Bridge Designs
1: Heraeus Electronics GmbH & Co. KG; 2: Nexperia B. V.; 3: Chemnitz University of Technology
A Concept for In-situ Glass-transition Detection in Insulated Metal Substrates
1: Department of Electron Devices, Budapest University of Technology and Economics, Budapest, Hungary; 2: Department of Electrical, Electronic, and Information Engineering, University of Bologna, Bologna, Italy
Experimental Investigation of In-situ Glass-transition Detection in Insulated Metal Substrates
1: Department of Electron Devices, Budapest University of Technology and Economics, Budapest, Hungary; 2: Department of Electrical, Electronic, and Information Engineering, University of Bologna, Bologna, Italy
Two-dimensional Cryogenic Micro-raman Stress Mapping in Silicon Around Through-silicon Vias and SLID Bond Interface
1: Chemnitz University of Technology, Germany; 2: Center for Materials, Architectures and Integration of Nanomembranes (MAIN), Chemnitz, Germany; 3: Fraunhofer ENAS, Chemnitz, Germany; 4: Center for Micro-and Nanotechnologies (ZfM), Chemnitz, Germany; 5: Joint Lab Berlin, Berlin-Adlershof, Germany
Validated Parametric MOR Approach for Thermal Modelling of Semiconductor Switches
1: Politecnico di Milano, Italy; 2: ABB S.p.A.
Deterministic, Solver-accurate Thermal and Warpage Analysis at Manufacturing Resolution for Advanced 2.5D HBM Packages
Vinci4d.ai, United States of America
Impact of Boundary Conditions on Topology Optimization of Fin Structures for PCM-based Battery Thermal Management
Università degli Studi di Napoli Federico II
Analytically Benchmarked Spatial and Temporal Discretization Guidelines for Finite Element Simulation of Thermal Waves
1: Berliner Nanotest and Design GmbH, Germany; 2: Chemnitz University of Technology, Germany; 3: Fraunhofer Institute for Electronics Nano Systems, Germay
Thermo-hydraulic Performance of a Tetrahedral Lattice Core under Laminar Flow: Effects of Strut Materials and Coolant Media
Atlantic Technological University, Ireland
Enhancing Flow Redistribution in Skived Heat Sinks for High-power Density Computing: An End-to-End Case Study
MegaCool Technologies, Belgium
A Systematic Study of Graphene-enhanced Heat Sinks for Lightweight Thermal Management Applications
1: Chalmers University of Technology, Sweden; 2: SHT Smart High-Tech AB, Sweden; 3: Saab AB, Sweden; 4: Volvo Car Corporation, Sweden
AI-driven, Non-parametric Geometry Optimization for Heat Sink Design
Synopsys Inc.
"From Power Delivery to Heat Dissipation: Materials Challenges for Scaled Electronics"
Bernd Gotsmann, IBM Research
Design and Development of Miniaturized Thermal Test Chip for Advanced Interconnect and Packaging Technologies
1: Berliner Nanotest und Design GmbH, Berlin, Germany; 2: Fraunhofer Institute for Electronic Nano Systems, Chemnitz, Germany; 3: TU Chemnitz, Center for Micro and Nano Technologies, Chemnitz, Germany
Thermomechanical Analysis and Validation of an Overmoulded Package Design for Improved Thermal Interface via Selective EMC Grinding
1: TU Chemnitz, Germany; 2: Fraunhofer IZM, Germany; 3: TU Berlin, Germany; 4: Fraunhofer ENAS, Germany
Experimental Investigation of Warpage-Induced Thermal Performance Degradation in HPC Packages Using Thermal Test Vehicles
1: DS&A LLC, United States of America; 2: NANOTEST, Berlin, Germany
Thermo-hydraulic Performance of Microchannel Heat Sinks with Square Pin-fin Geometries: A Numerical Investigation
1: Faculty of Engineering, Alexandria University, Alexandria, Egypt; 2: The University of Texas at Austin, Austin, TX 78758, USA; 3: Mechanical Power Department, Faculty of Engineering, Cairo University, Cairo, Egypt; 4: Department of Mechanical Power Engineering, Menoufia University, Menoufia, Egypt; 5: Power and Wide-Band-Gap Electronics Research Laboratory (POWERlab), EPFL, Lausanne, Switzerland; 6: School of Engineering, University of Greenwich, London, UK; 7: Department of Mechanical Power Engineering, Mansoura University, Mansoura, Egypt
A Comparative Study of Heat Conduction-Based Numerical Models for Vapor Chamber Thermal Analyses
1: ASELSAN, UGES Sector Directorate, Ankara, Türkiye; 2: Istanbul Technical University, Department of Mechanical Engineering, Istanbul, Türkiye
Hot Spot Prediction of a MOSFET Chip Using Machine Learning
1: Faculty of Electrical Engineering, Technical University of Cluj-Napoca, Romania; 2: Infineon Technologies AG, Munich, Germany; 3: Infineon Technologies, Bucharest, Romania
Efficient Electro-thermal Analysis of Power ICs Using a Hybrid Finite Element and Lumped-element Approach
1: Technical University of Cluj-Napoca, Romania; 2: KAI Kompetenzzentrum Automobil und Industrieelectronik GMBH,Austria; 3: Infineon Technologies Romania & Co, Romania
Experimental Investigation of Metal-Foam Pore Density in a PCM-Based Passive Module for Thermal Control of Electronic Components.
1: Department of Engineering,Università degli Studi della Campania “Luigi Vanvitelli”, Italy; 2: International Centre for Sustainable Energy Resource Management (iCERM), UNICAMPANIA Division.
Electro-thermal Modelling of 26650-format LiFePO4 Cell for Maritime Applications
1: Tecnalia, Derio; 2: University of Oviedo (Uniovi); 3: University of the Basque Country (UPV/EHU)
Experimental Validation of a Lumped Parameter Thermal Model for Spreading Resistance in Direct-cooled Power Electronics
1: Ghent University, Belgium; 2: FlandersMake@UGent – Core lab MIRO, Belgium; 3: University of Antwerp, Belgium; 4: University of Cape Town, South Africa
Experimental Performance Validation Of Flow Guider Structures For Direct Cooling Of Prismatic Battery Cells
1: Ghent University, Belgium; 2: FlandersMake@UGent – Core lab MIRO, Belgium; 3: University of Antwerp, Belgium; 4: University of Cape Town, South Africa
Numerical Investigation on Thermal Behaviour of Inclined Plate Heat Sink with Metal Foam Fins and PCM for Electronic Cooling
Universita' degli Studi della Campania "Luigi Vanvitelli", Italy
Modeling Study on Thermal Runaway of Battery System
Université polytechnique haut de France, France
