Conference Agenda

Overview and details of the sessions of this conference. Please select a date or location to show only sessions at that day or location. Please select a single session for detailed view (with abstracts and downloads if available).

Please note that all times are shown in the time zone of the conference. The current conference time is: 25th Aug 2026, 07:44:24pm CEST

 
Wed16Sept
Conference 1
Conference 2
Conference 1 + 2
No specific location / location unknown
8:00am
9:00am
10:00am
11:00am
12:00pm
1:00pm
2:00pm
3:00pm
4:00pm
5:00pm
6:00pm
7:00pm
8:00pm
9:00pm
S 2.A: Thermo-Mechanical Reliability 1
11:30am - 12:50pm
Conference 1
Location: Conference 1

Limits of Nickel Diffusion Barriers at High Operating Temperatures

Mathias Nowottnick, Andrej Novikov, Simon Purschke

University of Rostock, Germany



Smart Evaluation of Interconnect Quality Test Methods in LED Packages using Controlled Defects

Jennifer Rieder, Thomas Zahner, E Liu

ams-OSRAM international GmbH, Germany



Infrared Detection of Crack-Tip-Associated Thermal Signatures Under Cyclic Loading: From Bulk Plexiglas Specimens to Bimaterial Interfaces

Daniel May1, Marcus Schulz2, Mohamad Abo Ras2, Bernhard Wunderle1

1: University of Technology Chemnitz; 2: Berliner Nanotest und Design GmbH



Controlled Excitation of a Nonlinear Resonant Cantilever System for Experimental Delamination Characterization in High-Performance Computing Packages

David Walther1, Jörg Arnold1, Arash Mohammadi1, Karl Friedrich Becker2, Mathias Koch2, Bernhard Wunderle1,3,4,5

1: Chemnitz University of Technology, Dept. Materials & Reliability of Microsystems, Chemnitz, Germany; 2: Fraunhofer IZM, Berlin, Germany; 3: Fraunhofer ENAS, Chemnitz, Germany; 4: Centre for Micro- and Nanotechnologies (ZfM), Chemnitz, Germany; 5: Centre for Materials, Architectures and Integration of Nanomembranes (MAIN), Chemnitz, Germany

S 3.A: Thermo-Mechanical Reliability 2
2:00pm - 3:40pm
Conference 1
Location: Conference 1

Identifying Failure Root Causes at Cu-Cu Interfaces of Vias using EBAC Analysis

Lisa Mitterhuber1, Verena Leitgeb1, Julia Zündel2, Maike Sagerer2, Thomas Krivec2, Elke Kraker1

1: Materials Center Leoben Forschung GmbH, Austria; 2: AT & S Austria Technologie & Systemtechnik Aktiengesellschaft



Stacked Si-on–GaN Architectures: Unlocking Reliability for Ultra-Compact Half-Bridge Designs

Sri Sai Chandra Abhinay Nallam1, Benjamin Fabian1, Eric Hofmann1, Christoph Heldt1, Sebastian Fritzsche1, Patrick Heinickel1, Nick Liu2, Anu Mathew3

1: Heraeus Electronics GmbH & Co. KG; 2: Nexperia B. V.; 3: Chemnitz University of Technology



A Concept for In-situ Glass-transition Detection in Insulated Metal Substrates

János Hegedüs1, Gusztáv Hantos1, Gyula Lipák1, David Demian2, Andrea Cavallini2, András Poppe1, Ferenc Ender1

1: Department of Electron Devices, Budapest University of Technology and Economics, Budapest, Hungary; 2: Department of Electrical, Electronic, and Information Engineering, University of Bologna, Bologna, Italy



Experimental Investigation of In-situ Glass-transition Detection in Insulated Metal Substrates

Gusztáv Hantos1, János Hegedüs1, Gyula Lipák1, David Demian2, Andrea Cavallini2, András Poppe1, Ferenc Ender1

1: Department of Electron Devices, Budapest University of Technology and Economics, Budapest, Hungary; 2: Department of Electrical, Electronic, and Information Engineering, University of Bologna, Bologna, Italy



Two-dimensional Cryogenic Micro-raman Stress Mapping in Silicon Around Through-silicon Vias and SLID Bond Interface

Maham Ayaz1,2, Peter Meszmer1,2, Uwe Zschenderlein1, Susana Richter Trummer3, Matthias Prinz3, Bernhard Wunderle1,2,3,4,5

1: Chemnitz University of Technology, Germany; 2: Center for Materials, Architectures and Integration of Nanomembranes (MAIN), Chemnitz, Germany; 3: Fraunhofer ENAS, Chemnitz, Germany; 4: Center for Micro-and Nanotechnologies (ZfM), Chemnitz, Germany; 5: Joint Lab Berlin, Berlin-Adlershof, Germany

S 2.B: Thermal Simulations 1
11:30am - 12:50pm
Conference 2
Location: Conference 2

Validated Parametric MOR Approach for Thermal Modelling of Semiconductor Switches

Lorenzo Codecasa1, Samuele Foresti2, Luca Raciti2, Thomas Masper2, Enrico Ragaini2, Paolo Maffezzoni1, Dario D'Amore1

1: Politecnico di Milano, Italy; 2: ABB S.p.A.



Deterministic, Solver-accurate Thermal and Warpage Analysis at Manufacturing Resolution for Advanced 2.5D HBM Packages

Rahima Mohammed, Hardik Kabaria, Satish Radhakrishnan, Vincent Rerolle, William Stark, Sarah Osetonski, John Bruggeman, Matteo Frigo, Nimish Patil, Balaji Cherukuri

Vinci4d.ai, United States of America



Impact of Boundary Conditions on Topology Optimization of Fin Structures for PCM-based Battery Thermal Management

Nicola Bianco, Andrea Fragnito, Marcello Iasiello, Vittorio Orlanducci, Francesco Piccirillo

Università degli Studi di Napoli Federico II



Analytically Benchmarked Spatial and Temporal Discretization Guidelines for Finite Element Simulation of Thermal Waves

Kaushal Arun Pareek1, Daniel May2, Peter Meszmer2, Bernhard Wunderle2,3, Mohamad Abo Ras1

1: Berliner Nanotest and Design GmbH, Germany; 2: Chemnitz University of Technology, Germany; 3: Fraunhofer Institute for Electronics Nano Systems, Germay

S 3.B: Computational Fluid Dynamics
2:00pm - 3:40pm
Conference 2
Location: Conference 2

Thermo-hydraulic Performance of a Tetrahedral Lattice Core under Laminar Flow: Effects of Strut Materials and Coolant Media

Ali Riaz, Mohammadreza Kadivar, John Lohan, David Tromey, Gerard McGranaghan

Atlantic Technological University, Ireland



Enhancing Flow Redistribution in Skived Heat Sinks for High-power Density Computing: An End-to-End Case Study

Ine Vandebeek, Lieven Vervecken, Rui Vieira

MegaCool Technologies, Belgium



A Systematic Study of Graphene-enhanced Heat Sinks for Lightweight Thermal Management Applications

Markus Enmark1, Lijie He2, Muhammad Hassan2, Sajjad Pashazadeh1, Torbjörn M.J. Nilsson3, Arian Kamal4, Kai J. Kallio4, Johan Liu1

1: Chalmers University of Technology, Sweden; 2: SHT Smart High-Tech AB, Sweden; 3: Saab AB, Sweden; 4: Volvo Car Corporation, Sweden



AI-driven, Non-parametric Geometry Optimization for Heat Sink Design

Achref Rabhi, Daniel Haase, Sivasubramani Krishnaswamy, Julio Benavides Rodriguez, Tobias Berg

Synopsys Inc.

Welcome
8:50am - 9:00am
Conference 1 + 2
Location: Conference 1 + 2
Keynote 1
9:00am - 9:45am
Conference 1 + 2
Location: Conference 1 + 2

"From Power Delivery to Heat Dissipation: Materials Challenges for Scaled Electronics"
Bernd Gotsmann, IBM Research

S 1: High-Performance Computing
9:45am - 10:45am
Conference 1 + 2
Location: Conference 1 + 2

Design and Development of Miniaturized Thermal Test Chip for Advanced Interconnect and Packaging Technologies

Corinna Grosse-Kockert1, Vikas Dubey2, Maik Sternberg1, Dirk Wünsch2, Karla Hiller3, Sven Rzepka2, Mohamad Abo Ras1

1: Berliner Nanotest und Design GmbH, Berlin, Germany; 2: Fraunhofer Institute for Electronic Nano Systems, Chemnitz, Germany; 3: TU Chemnitz, Center for Micro and Nano Technologies, Chemnitz, Germany



Thermomechanical Analysis and Validation of an Overmoulded Package Design for Improved Thermal Interface via Selective EMC Grinding

Baris Erol1, Mathias Koch2, Marcus Voitel2, Ole Hölck2, Leonie Leadbetter2, Karl-Friedrich Becker2,3, Tanja Braun2,3, Daniel May1, Bernhard Wunderle1,4

1: TU Chemnitz, Germany; 2: Fraunhofer IZM, Germany; 3: TU Berlin, Germany; 4: Fraunhofer ENAS, Germany



Experimental Investigation of Warpage-Induced Thermal Performance Degradation in HPC Packages Using Thermal Test Vehicles

Dave Saums1, Dan R. Wargulski2, Maik Sternberg2, Mohamad Abo Ras2

1: DS&A LLC, United States of America; 2: NANOTEST, Berlin, Germany

Vendor Session 1
10:45am - 11:05am
Conference 1 + 2
Location: Conference 1 + 2
PS_A: Poster Session A
3:40pm - 4:40pm
Conference 1 + 2
Location: Conference 1 + 2

Thermo-hydraulic Performance of Microchannel Heat Sinks with Square Pin-fin Geometries: A Numerical Investigation

Ashraf Morsi1, Mohammed Abdel Razzaq2, Youssef Khalid3, Mohamed Naser1, Mohamed Elkholy4, Ibrahim Elhagali4,5, Osama Maklad6,7

1: Faculty of Engineering, Alexandria University, Alexandria, Egypt; 2: The University of Texas at Austin, Austin, TX 78758, USA; 3: Mechanical Power Department, Faculty of Engineering, Cairo University, Cairo, Egypt; 4: Department of Mechanical Power Engineering, Menoufia University, Menoufia, Egypt; 5: Power and Wide-Band-Gap Electronics Research Laboratory (POWERlab), EPFL, Lausanne, Switzerland; 6: School of Engineering, University of Greenwich, London, UK; 7: Department of Mechanical Power Engineering, Mansoura University, Mansoura, Egypt



A Comparative Study of Heat Conduction-Based Numerical Models for Vapor Chamber Thermal Analyses

Ahmet Çömez1, Sertaç Çadırcı2, Ozan Atalay1, Ali Eray Torun1, Caner Demir1, Hakan Uysal1

1: ASELSAN, UGES Sector Directorate, Ankara, Türkiye; 2: Istanbul Technical University, Department of Mechanical Engineering, Istanbul, Türkiye



Hot Spot Prediction of a MOSFET Chip Using Machine Learning

Alexandru-Dumitru Buburuzan1, Georg Pelz2, Andi Buzo2, Roxana-Daniela Florescu3, Marius-Ioan Purcar1, Sebastian Wittmann2

1: Faculty of Electrical Engineering, Technical University of Cluj-Napoca, Romania; 2: Infineon Technologies AG, Munich, Germany; 3: Infineon Technologies, Bucharest, Romania



Efficient Electro-thermal Analysis of Power ICs Using a Hybrid Finite Element and Lumped-element Approach

Luiza Dobre1, Adrian Bojita1, Marius Purcar1, Daniel Tscharnuter2, Manuel Petersmann2, Cristian Boianceanu3

1: Technical University of Cluj-Napoca, Romania; 2: KAI Kompetenzzentrum Automobil und Industrieelectronik GMBH,Austria; 3: Infineon Technologies Romania & Co, Romania



Experimental Investigation of Metal-Foam Pore Density in a PCM-Based Passive Module for Thermal Control of Electronic Components.

Hala Salhab1,2, Oronzio Manca1,2, Bernardo Buonomo1,2, Sergio Nardini1,2

1: Department of Engineering,Università degli Studi della Campania “Luigi Vanvitelli”, Italy; 2: International Centre for Sustainable Energy Resource Management (iCERM), UNICAMPANIA Division.



Electro-thermal Modelling of 26650-format LiFePO4 Cell for Maritime Applications

Ane Sainz De La Maza1,3, Ainhoa Odriozola1, Enrique E. Valdés2, Victor M. García2, Elena Trancho1, Edorta Ibarra3, David Ansean2

1: Tecnalia, Derio; 2: University of Oviedo (Uniovi); 3: University of the Basque Country (UPV/EHU)



Experimental Validation of a Lumped Parameter Thermal Model for Spreading Resistance in Direct-cooled Power Electronics

Lander Lode Cnudde1,2, Jasper Nonneman1,2,3, Jana Rogiers1,2, Michiel De Paepe1,2, Michel De Paepe1,2,4

1: Ghent University, Belgium; 2: FlandersMake@UGent – Core lab MIRO, Belgium; 3: University of Antwerp, Belgium; 4: University of Cape Town, South Africa



Experimental Performance Validation Of Flow Guider Structures For Direct Cooling Of Prismatic Battery Cells

Lander Lode Cnudde1,2, Jana Rogiers1,2, Michiel De Paepe1,2, Jasper Nonneman1,2,3, Michel De Paepe1,2,4

1: Ghent University, Belgium; 2: FlandersMake@UGent – Core lab MIRO, Belgium; 3: University of Antwerp, Belgium; 4: University of Cape Town, South Africa



Numerical Investigation on Thermal Behaviour of Inclined Plate Heat Sink with Metal Foam Fins and PCM for Electronic Cooling

Aanandsundar Arumugam, Meriem Bounib, Bernardo Buonomo, Oronzio Manca, Sergio Nardini

Universita' degli Studi della Campania "Luigi Vanvitelli", Italy



Modeling Study on Thermal Runaway of Battery System

Ranim Elogb, Safouene Ouenzerfi, Mustapha Mahdaoui, Souad Harmand

Université polytechnique haut de France, France

Registration
8:00am - 8:50am
Coffee Break 1
11:05am - 11:30am
Lunch
12:50pm - 2:00pm
Coffee Break 2 and Poster Viewing
4:40pm - 6:30pm
Welcome Reception
7:00pm - 9:00pm