Electrothermal Performance Enhancement of Silicon Carbide Gate-All-Around MOSFETs Using a Ferroelectric Gate Stack

Vincenzo Terracciano¹, Alessandro Borghese¹, Marco Boccarossa¹, Andrea Irace¹, Giovanni Salvatore², Luca Maresca¹

1: University of Naples Federico II, Italy; 2: Ca’ Foscari University of Venice, Italy

Dielectric Liquid Cooling of 2.0 kV SiC MOSFET Power Module Using Jet Impingement and Pumped Immersion Flow

Till Huesgen, Johann Renner, Balasubramanian Vaidyanathan, Vladimir Polezhaev

Hochschule Kempten - University of Applied Sciences, Germany

A Comparative Analysis of the Thermal Performance of DBC and Novel IMS Substrates of IGBT Devices

János Hegedüs¹, Gusztáv Hantos¹, Gyula Lipák¹, Andrea Reolon², András Poppe¹, Ferenc Ender¹

1: Budapest University of Technology and Economics, Hungary; 2: Serigroup, Italy

Multiphysics Simulations for IGBT Power Semiconductor Module Cooling

Péter Pálovics¹, Eeli Kerttula², Atte Hoffrén², Joonas Leppänen², Ferenc Ender¹

1: Budapest University of Technology and Economics, Budapest, Hungary; 2: ABB Oy, Motion, Technology Collaboration Office, Helsinki, Finland

Integrated Modelling Framework for 3D IC Package Thermal Design

Sudarshan Deo¹, Andras Vass-Varnai¹, Peter Gabor Szabo²

1: Siemens EDA, United States of America; 2: Budapest University of Technology and Economics

Simplified Thermal Transient Testing: Unlocking Affordable, Open-source Solutions

Nils Jonas Ziegeler^1,2, Stefan Schweizer^1,3

1: South Westphalia University of Applied Science; 2: Forvia SE; 3: Fraunhofer Application Center for Inorganic Phosphors

Comparative Analysis of TPMS Structures for Optimized CPU/GPU Thermal Management Using Generative Design

Ine Vandebeek, Ramadan Krasniqi, Luis Cusicanqui, Lieven Vervecken

Diabatix, Belgium

Influence of Heat Source Dimensions and Heat Transfer Coefficient Value on Temperature of Electronic Circuits Cooled by Free Convection

Marcin Janicki

Lodz University of Technology, Poland

Study of Breakdown Mechanisms in GaN/AlGaN HEMTs Under Various Short Circuit Tests Using p-GaN Schottky Gate Current as Thermal Sensitive Parameter

Christale Crouard^1,2, Mickael Rouch¹, Jonathan Godillon¹, Julio Brandelero¹, Patrick Tounsi²

1: STMicroelectronics, France; 2: LAAS-CNRS, France

Toward Real-Time Junction Temperature Estimation with a Physics-Informed Attention LSTM

Alessandro Varaldi¹, Maurizio Tranchero², Lorenzo Giraudi², Claudio Genta², Marco Vacca¹

1: Politecnico di Torino, Italy; 2: Ideas & Motion

K-factor Calibration Issues of IGBTs

Gusztáv Hantos, János Hegedüs, Gyula Lipák, András Poppe, Ferenc Ender

Budapest University of Technology and Economics, Hungary

Development of a Surrogate Model for a Phase Change Material Heat Sink for Thermal Buffering of Power Electronics

Maité Goderis^1,2, Jana Rogiers^1,2, Michiel De Paepe¹, Wito Plas^1,2, Hendrik Vansompel^1,2, Michel De Paepe^1,2,3

1: Ghent University, Department of Electromechanical, Systems and Metal Engineering, Sint-Pietersnieuwstraat 41, Ghent, 9000, Belgium; 2: FlandersMake@UGent – Core lab MIRO, Ghent, 9000, Belgium; 3: University of Cape Town, Department of Mechanical Engineering, Private Bag X3, Rondebosch 7701, South Africa

Reliability of High-Power LEDs Under Varying Thermal Aging Conditions

Andreas Zippelius, Elias Hufnagel, Jainam Shah, Maximilian Schmid, Gordon Elger

Technische Hochschule Ingolstadt, Germany

Extrinsic Failure of High-power Blue LEDs for Horticulture Applications Stressed in Hot Environments

Alessandro Caria, Riccardo Fraccaroli, Giulia Pierobon, Thomas Castellaro, Ambrogio Huang, Carlo De Santi, Matteo Buffolo, Nicola Trivellin, Enrico Zanoni, Gaudenzio Meneghesso, Matteo Meneghini

University of Padova, Italy

Thermal Aspects of Infrared LED Sources Interfering with Military Night Vision Systems

János Hegedüs, Gusztáv Hantos, András Poppe

Budapest University of Technology and Economics, Hungary

Electro-thermal Circuit Models of PhotoVoltaic Cells Subjected to Optical Degradation Phenomena

Marco Balato¹, Martina Botti^2,3, Antonio Pio Catalano¹, Luigi Costanzo², Vincenzo d'Alessandro¹, Athanasios G. Papathanasiou⁴, Carlo Petrarca¹, Ciro Scognamillo¹, Luigi Verolino¹, Massimo Vitelli²

1: University of Naples Federico II, Italy; 2: University of Campania "Luigi Vanvitelli"; 3: University of Salerno; 4: National Technical University of Athens