Conference Agenda

Raman Thermometry: A Simultaneous Structural And Thermal Characterization Technique For GeSbTe Based Phase Change Materials

Akash Patil^1,2, Tushar Chakrabarty^1,2, Yannick Le-Friec², Jury Sandrini², Roberto Simola³, Simon Jeannot², Philippe Boivin³, Emmanuel Dubois¹, Jean-Francois Robillard¹

¹Univ. Lille, Lille, France; ²STMicroelectronics, Crolles, France; ³STMicroelectronics, Rousset, France

Layer Resolved Thermal Impedance Measurement with Laser Stimulated Transient Thermal Analysis of Semiconductor Modules

Hannes Schwan, Maximilian Schmid, Gordon Elger

Technische Hochschule Ingolstadt, Ingolstadt, Germany

Thermal Performance Comparison of an Adjustable Air Amplifier with Rotary Fans

David W. Salter^1,2, Eoin H. Oude Essink^1,2, Gordon O'Brien², Tim Persoons², Sajad Alimohammadi^1,2

¹School of Mechanical Engineering, Technological University Dublin, Ireland; ²Department of Mechanical, Manufacturing & Biomedical Engineering, Trinity College Dublin, Ireland