Conference Agenda

4:30pm - 4:50pm

Multifidelity reliability estimation

C. Proppe

Karlsruhe Institute of Technology, Germany

4:50pm - 5:10pm

Stochastic multi-level analysis of bone tissue

S. K. Shivanand, B. Rosic, H. G. Matthies

TU Braunschweig, Germany

5:10pm - 5:30pm

Bayesian inversion for electrical impedance tomography

M. Multerer, R. Gantner

Università della Svizzera Italiana, Switzerland

5:30pm - 5:50pm

Bayesian analysis for Poisson-Boltzmann equation modeling electrical impedance tomography devices

L. Taghizadeh, C. Heitzinger

TU Vienna, Austria

5:50pm - 6:10pm

Parameter estimation in a macroscopic production model based on a PDMP

S. Göttlich, S. Knapp, C. Schillings

University of Mannheim, Germany

6:10pm - 6:30pm

Bayesian inversion for nanoscale field-effect sensors using the stochastic drift-diffusion-Poisson-Boltzmann system

A. Khodadadian^1,2, C. Heitzinger^2,3

¹Leibniz University of Hannover, Germany; ²Technical University of Vienna, Germany; ³Arizona State University, USA